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Keithley 2461 Hi Curr Interactive SourceMeter with 10A Pulse & Digitizer

$8,820.00

A high-current interactive SourceMeter® SMU instrument with built-in digitizing capability, sourcing up to 10 A pulse and 105 V, ideal for power devices, advanced materials, and fast transient characterization.

The Keithley 2461 High Current SourceMeter® is a next-generation SMU (Source Measure Unit) designed for high-current and fast transient testing. With the ability to source up to 105 V, 7 A DC, or 10 A pulse (100 W max), the 2461 provides the power and accuracy required for modern power semiconductor devices and energy components.

Equipped with an integrated digitizer, the 2461 enables high-speed current and voltage waveform capture, making it ideal for analyzing transient behavior in devices such as MOSFETs, IGBTs, LEDs, solar cells, and batteries. Its intuitive Touch, Test, Invent® (TTI) graphical touchscreen interface streamlines test setup and operation, while scripting and automation support enhance productivity in both R&D and production environments.

Key Features:

  • Source up to 105 V, 7 A DC, or 10 A pulse (100 W max)

  • Integrated digitizer for high-speed transient waveform capture

  • 6½-digit measurement resolution with sensitivity down to 10 fA / 100 nV

  • Touchscreen TTI interface for intuitive operation

  • Combines power supply, current source, DMM, electronic load, and digitizer in one unit

Compatible Applications/Materials:

  • Power semiconductors (MOSFETs, IGBTs, diodes)

  • Solar cells, LEDs, and optoelectronic devices

  • Energy storage and battery testing

  • Advanced materials and transient analysis in R&D

Included Accessories:
Power cord, safety interlock cable, test lead set, user documentation, and calibration certificate.

Compliance & Standards:
Meets CE, UL, and ISO/IEC requirements; suitable for GLP-compliant laboratory and production environments.

Benefits for Lab Users:

  • Provides precision high-current sourcing with digitized measurement capability

  • Enables transient and dynamic testing not possible with standard SMUs

  • Reduces equipment footprint by combining multiple instruments in one

  • Simplifies complex test setups with touchscreen interface and automation support