Keysight 66309D Dual Mobile Communications DC Source with VM

The Keysight 66309D Dual Mobile Communications DC Source is engineered to meet the demanding power requirements of mobile devices and wireless communication modules. With two independent channels, it enables simultaneous powering of multiple devices or circuits, making it ideal for R&D labs and production test environments.

This DC source features advanced battery emulation, replicating real-world battery behavior to support precise device characterization and charging circuit validation. The built-in voltmeter (VM) allows direct measurement at the device under test (DUT), eliminating the impact of lead resistance and improving measurement accuracy.

With an output range of 0–15V and up to 3A per channel, the 66309D offers fast transient response and low output noise, essential for testing GSM, CDMA, LTE, and 5G handsets where devices draw bursty currents. Its dual-channel design, combined with integrated measurement functions, reduces setup complexity while delivering highly repeatable results.

Key Features:

• Dual-channel DC source with up to 15V, 3A per channel

• Battery emulation for realistic test scenarios

• Integrated voltmeter (VM) for accurate point-of-load voltage measurements

• Fast transient response for GSM/CDMA/LTE/5G device testing

• Low noise and superior regulation for sensitive circuits

• Supports both R&D prototyping and production test environments

Compatible Applications:
Wireless handset testing, telecom module validation, battery charging analysis, mobile communications R&D, production test systems.

Included Accessories:
Standard power cord, calibration certificate, and user documentation.

Compliance:
Meets ISO, CE, and Keysight calibration standards; suitable for GLP-compliant laboratories.

Benefits for Lab Users:
The 66309D combines dual outputs, battery emulation, and integrated voltage measurement in one compact instrument. By providing accurate, repeatable, and battery-like power, it streamlines device validation, reduces test variability, and accelerates development cycles for wireless communications products.