Keysight 33510B Waveform Generator, 20MHz, 2 Channel

The Keysight 33510B Waveform Generator is a high-performance 2-channel function generator designed for engineers, researchers, and educators needing reliable and accurate waveform generation up to 20 MHz. It delivers low-distortion sine, square, triangle, ramp, and pulse waveforms, making it suitable for a wide range of analog, digital, and mixed-signal applications.

Both channels can operate independently or be synchronized for multi-signal testing. The generator also includes advanced modulation options, such as AM, FM, PM, FSK, and sweep, enabling complex testing for research, laboratory, and production applications. The 33510B features an intuitive interface, high-resolution display, and versatile connectivity options (USB, LAN/LXI, optional GPIB), supporting both standalone operation and integration into automated test systems.

Compact, robust, and easy to operate, the 33510B is ideal for educational labs, R&D facilities, calibration labs, and production environments.

Key Features:

• 20 MHz output bandwidth

• Dual independent output channels

• Standard waveforms: sine, square, triangle, ramp, pulse

• Advanced modulation: AM, FM, PM, FSK, sweep

• Intuitive interface with high-resolution display

• USB and LAN/LXI standard; optional GPIB for automated test integration

• Compact and robust design for lab, production, and educational use

Compatible Accessories:

• Waveform generation software and cables

• Optional high-stability OCXO timebase

Included Accessories:
Power cord, test leads, user manual, and calibration certificate

Compliance:

• ISO 9001 quality manufacturing

• ISO 17025 traceable calibration

• LXI-compliant for automated test systems

Benefits for Lab & Field Users:

• Generates precise, low-distortion dual-channel signals

• Supports independent or synchronized multi-channel testing

• Compact and user-friendly design for labs, R&D, and production

• Advanced modulation options for diverse waveform testing

• Seamlessly integrates into automated test systems