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Keithley 7710 Solid State Multiplexer Card, 20 Channel, 60V

$812.00

A high-performance 20-channel solid-state multiplexer card for switching up to 60V, designed for automated testing and high-precision measurements in laboratory and production environments.

The Keithley 7710 Solid State Multiplexer Card is a 20-channel switching solution designed to streamline automated testing and precision measurement workflows. It enables engineers, technicians, and researchers to route multiple signals efficiently without mechanical wear, ensuring consistent performance and long-term reliability. The 7710 supports voltages up to 60V, making it suitable for a wide range of DC and low-voltage testing applications, including R&D, laboratory experiments, and production testing.

Engineered with solid-state technology, this multiplexer card provides fast, reliable switching with minimal crosstalk and low channel-to-channel leakage, preserving signal integrity for sensitive measurements. It integrates seamlessly with Keithley source-measure units (SMUs), digital multimeters (DMMs), and automated test systems, offering flexible routing of multiple test points while reducing setup complexity and testing time.

Key Features:

  • 20 solid-state channels for high-speed, reliable switching

  • Maximum voltage: 60V DC

  • Low crosstalk and minimal channel leakage for signal integrity

  • Ideal for automated testing and precision measurement applications

  • Compatible with Keithley SMUs, DMMs, and automated test systems

Compatible Equipment:

  • Keithley Source-Measure Units (SMUs)

  • Digital Multimeters (DMMs)

  • Automated test and data acquisition systems

Included Accessories:
7710 multiplexer card, installation guide

Compliance:

  • ISO 9001 quality manufacturing

  • Meets Keithley precision and safety standards

Benefits for Lab & Field Users:

  • Simplifies multi-point testing with 20 channels

  • Provides reliable, fast, and accurate signal switching

  • Preserves measurement integrity with solid-state technology

  • Reduces test setup complexity and increases throughput

  • Ideal for R&D, laboratory, calibration, and production testing