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Keysight 34945A Microwave Switch/Attenuator Driver for 34980A

$1,350.00

The Keysight 34945A is a microwave switch and attenuator driver module for the 34980A system, designed to provide reliable control of external RF and microwave switches or attenuators in automated test environments.

The Keysight 34945A Microwave Switch/Attenuator Driver is a dedicated driver module that extends the functionality of the Keysight 34980A Multifunction Switch/Measure Unit. Engineered to control external microwave switches and attenuators, this module simplifies integration of RF and microwave components into automated test systems. With support for multiple switch driver topologies, the 34945A enables high-performance RF routing and attenuation without the need for custom wiring or complex external drivers. Its plug-in design allows seamless installation into the 34980A mainframe, while front-panel indicators provide clear status monitoring.

The 34945A is ideal for aerospace, defense, telecommunications, and advanced R&D applications where RF and microwave signal management is critical. Its robust, Keysight-quality design ensures long-term reliability and system-level compatibility.

Key Features:

  • Dedicated driver for external microwave switches and attenuators

  • Seamless integration with Keysight 34980A systems

  • Simplifies RF/microwave test system design

  • Front-panel indicators for status monitoring

  • Supports a wide range of RF/microwave applications

Compatible Measurements/Chemicals:
Supports switching and attenuation of RF/microwave signals; not intended for direct chemical applications.

Included Accessories:
Ships with connector blocks, hardware kit, and user documentation.

Compliance:
Meets ISO, CE, and Keysight quality standards; suitable for GLP-compliant test laboratories.

Benefits for Lab Users:
The Keysight 34945A streamlines the integration of microwave switches and attenuators into automated test setups, eliminating the need for custom driver circuits. Its reliable design saves time, reduces complexity, and enhances test efficiency in demanding RF and microwave applications.