Keysight 53230A-010 Ultra High-Stability OCXO Timebase Upgrade

The Keysight 53230A-010 Ultra High-Stability OCXO Timebase Upgrade significantly improves the performance of the Keysight 53230A Universal Counter/Timer by replacing the standard timebase with a premium oven-controlled crystal oscillator (OCXO). This upgrade delivers superior frequency accuracy, low phase noise, and long-term stability, ensuring precise measurements in the most demanding test environments.

With the 53230A-010 installed, users benefit from enhanced confidence in measurement results, particularly in applications where stability and accuracy are critical, such as telecommunications, aerospace, defense, and precision laboratory research. This timebase upgrade also reduces the need for frequent calibration, lowering long-term maintenance costs.

The OCXO operates in a temperature-controlled oven, minimizing the effects of ambient temperature changes and aging. It is designed for seamless integration into the 53230A platform, preserving all standard instrument features, including 12 digits/s resolution, 20 ps time interval resolution, and flexible connectivity via LAN, USB, and GPIB.

Key Features:

• Ultra high-stability OCXO timebase upgrade for 53230A

• Provides superior frequency accuracy and stability over standard oscillators

• Reduces phase noise for cleaner measurements

• Long-term stability minimizes recalibration needs

• Factory or field-installable upgrade option

• Ideal for telecom, aerospace, defense, and high-precision labs

Compatible Equipment:
Keysight 53230A Universal Counter/Timer (required).

Included Accessories:
OCXO module installed in the unit; documentation included.

Compliance:
Meets ISO, CE, and LXI Class C standards; suitable for GLP-compliant labs.

Benefits for Lab Users:
The 53230A-010 upgrade ensures unmatched timing and frequency accuracy, enabling engineers and researchers to perform critical measurements with confidence. By extending the counter’s stability and reducing drift, it delivers long-term value and reliability in precision test environments.