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Keithley 6517B/J Electrometer/High Resistance Meter

$8,680.00

A high-precision electrometer and resistance meter with integrated voltage sourcing, ideal for ultra-low current, high-resistance, and high-impedance voltage measurements in advanced electronics, materials science, and insulation testing.

The Keithley 6517B/J Electrometer/High Resistance Meter is engineered for researchers and engineers who require exceptional sensitivity and accuracy in measuring extremely low currents, high resistances, and high-impedance voltages. With its femtoamp-level current resolution and ability to measure resistances beyond 10^16 Ω, it is the instrument of choice for cutting-edge applications in semiconductors, advanced materials, and dielectric analysis.

Equipped with a programmable 1kV internal voltage source, the 6517B/J enables comprehensive resistivity, leakage current, and insulation resistance testing in a single, streamlined setup. This integration eliminates the need for external sourcing hardware, reducing complexity and ensuring reliable data acquisition.

Key Features:

  • Current measurement sensitivity down to femtoamps

  • Resistance measurements up to 10^16 Ω

  • Built-in 1kV programmable voltage source

  • High input impedance for precision with high-resistance materials

  • Optimized for research, QA, and production test environments

Compatible Applications:

  • Semiconductor device and component testing

  • Dielectric and insulation resistance measurements

  • Surface and volume resistivity characterization

  • Capacitor leakage and material breakdown studies

Included Accessories:

  • Standard measurement leads

  • User documentation and quick-start guide

  • Optional test fixtures available separately

Compliance:

  • ISO 9001 certified manufacturing

  • CE, UL, and global safety/test compliance standards

Benefits for Lab & Field Users:

  • Ultra-sensitive performance for low-current and high-resistance measurements

  • Integrated voltage source saves space and streamlines workflows

  • Provides accurate, repeatable data for advanced R&D and QA testing

  • Expands testing capability in semiconductor, materials, and electronic research