The Keysight 33612A Waveform Generator provides dual-channel waveform generation with a maximum bandwidth of 80 MHz, designed for engineers, researchers, and technicians who need precise, repeatable signals. Utilizing Trueform waveform technology, the 33612A delivers low-distortion, accurate waveforms that surpass conventional arbitrary waveform generators in both performance and signal fidelity.
This dual-channel generator supports standard waveforms including sine, square, triangle, ramp, and pulse, as well as arbitrary waveforms. Advanced modulation capabilities—AM, FM, PM, FSK, and sweep—allow versatile testing of analog, digital, and mixed-signal circuits. The generator features an intuitive interface, high-resolution display, and flexible connectivity options (USB, LAN/LXI, optional GPIB), supporting both standalone operation and integration into automated test systems.
Perfect for educational labs, R&D, calibration, and production environments, the 33612A combines compact design, robust performance, and Keysight reliability for consistent waveform generation.
Key Features:
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80 MHz output bandwidth for high-speed applications
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Dual output channels with Trueform waveform technology
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Standard waveforms: sine, square, triangle, ramp, pulse, arbitrary
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Advanced modulation: AM, FM, PM, FSK, sweep
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High-resolution display and user-friendly interface
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USB and LAN/LXI standard; optional GPIB for automated test integration
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Compact, reliable design suitable for lab, production, and educational environments
Compatible Accessories:
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Optional OCXO high-stability timebase
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Waveform generation software and cables
Included Accessories:
Power cord, user manual, and calibration certificate
Compliance:
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ISO 9001 quality manufacturing
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ISO 17025 traceable calibration
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LXI-compliant for automated test systems
Benefits for Lab & Field Users:
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Provides precise, low-distortion dual-channel waveform generation
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Supports complex modulation and arbitrary waveform creation
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Compact and easy-to-use for labs, R&D, and production setups
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Integrates seamlessly into automated test systems
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Reliable performance for educational, research, and industrial applications



